CARBIDE FILM FILMS BY CHEMICAL DEPOSITION FROM THE GAS PHASE IN A REACTOR WITH COLD WALLS
Abstract
About the Authors
Vladimir MartensRussian Federation
Svyatoslav Krandievsky
Russian Federation
Ilya Nikitin
Russian Federation
References
1. Chelnokov V. E., Syrkin A. L. High temperature electronics using Sic: actual situation and unsolved problems // Materials science and Engineering B. 1997. V. 46. P. 248-253.
2. Хениш Г., Рой Р. М. Карбид кремния / пер. с англ. М.: Мир, 1972. 349 с.
3. Физические методы исследования материалов твердотельной электроники / С. И. Рембеза, Б. М. Синельников, Е. С. Рембеза, Н. И. Каргин. Ставрополь: СевКавГТУ, 2002. 432 с.
4. Chen J., Steckl A., Loboda M. Grows and Characterization of N-doped SiC Films from Trimethylsilane // Materials science forum. 2000. V. 338-342. P. 273-276.
Review
For citations:
Martens V., Krandievsky S., Nikitin I. CARBIDE FILM FILMS BY CHEMICAL DEPOSITION FROM THE GAS PHASE IN A REACTOR WITH COLD WALLS. Newsletter of North-Caucasus Federal University. 2017;(3):24-27. (In Russ.)